|RFx ID :||20072036|
|Tender Name :||Benchtop Scanning Electron Microscope|
|Reference # :||TR2017-34|
|Open Date :||Monday, 27 August 2018 1:30 PM (Pacific/Auckland UTC+12:00)|
|Close Date :||Friday, 21 September 2018 3:00 PM (Pacific/Auckland UTC+12:00)|
|Tender Type :||Request for Tenders (RFT)|
|Tender Coverage :||Sole Agency [?]|
|Required Pre-qualifications :||None|
|Alternate Physical Delivery Address :|
|Alternate Physical Fax Number :|
The Orthopaedic Surgery and MSM (UOC) requires a benchtop SEM capable of high-resolution electron imaging of both material and biological samples. The SEM must be capable of providing quantitative information of surface topography but also allow imaging of wet biological specimens under low vacuum conditions. Financial considerations include the initial purchase price of the microscope and the cost for its ongoing operation.
To ensure that the benchtop SEM satisfies the requirement of different research groups and provide great benefits to the Department, different needs should be considered in the procurement process. The equipment must meet essential technical abilities to carry out required research, it must meet key performance indicators such as low and high vacuum imaging capability. It must be user-friendly thereby ensuring minimum technical experience required allowing different members from multiple departments of the school to use the SEM independently. It must be robust and small so that it can be relocated if required. It must provide good value to the University in terms of up-front costs and the total life cost of the equipment including training and maintenance. A future upgrade of the new benchtop SEM could also be considered in the future to satisfy new avenues of research and extend the life and use of the equipment.
It is essential that the equipment should have at least two vacuum modes, to allow imaging of electronically robust samples like metals and metal alloys but also biological samples or soft hydrogels that need extensive sample treatment to make them suitable to be imaged using an electron beam. The capability of the purchased equipment to be used with minimal sample preparation will facilitate researchers from different departments to use this equipment with minimal training.
For more information, please view the attachments.